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Authors
(10)
Benoit Charlot (Benoît Charlot)
1
Stefan Dilhaire
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Pascal Vairac
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Sebastian G. Volz
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Gilles Tessier
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Severine Gomes (Séverine Gomès)
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Francois Nepveu (François Nepveu)
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TCPMT - IEEE Transactions on Components, Packaging and Manufacturing Technology
IEEE Transactions on Components, Packaging and Manufacturing Technology,TCPMT,Engineering
TCPMT - IEEE Transactions on Components, Packaging and Manufacturing Technology
Publications: 1
|
Citation Count: 2 (Self-Citation: 0)
Year Range: 2007-2007
Fields of study:
Engineering
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Publications
(1)
Temperature measurement of sub-micrometric ICs by scanning thermal microscopy
(
Citations: 2
)
S. Gomès
,
Po Chapuis
,
F. Nepveu
,
N. Trannoy
,
S. Volz
,
B. Charlot
,
Gilles Tessier
,
S. Dilhaire
,
Bernard Cretin
,
Pascal Vairac
Journal:
IEEE Transactions on Components, Packaging and Manufacturing Technology - TCPMT
, 2007
TCPMT - IEEE Transactions on Components, Packaging and Manufacturing Technology